Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices

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Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices.

Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO(2)-Si film-substrate system at the 6328-A He-Ne laser wavelength.

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ژورنال

عنوان ژورنال: Applied Optics

سال: 1982

ISSN: 0003-6935,1539-4522

DOI: 10.1364/ao.21.000739